Padilla, José Luis , BENÍTEZ BAENA, ISABEL, van de Vijver, Fons J.R.
No
Advances in Comparative Survey Methods: Multinational, Multiregional and Multicultural Contexts (3MC)
Capítulo de un Libro
Científica
✗
Internacional
https://onlinelibrary.wiley.com/doi/book/10.1002/9781118884997
28/09/2018
10.1002/9781118884997.ch3