Título Extended X-ray absorption fine structure (EXAFS) investigations of Ti bonding environment in sputter-deposited nanocomposite TiBC/a-C thin films
Autores ENDRINO ARMENTEROS, JOSÉ LUIS, Abad M.D. , Gago R. , Horwat D. , Jiménez I. , Sánchez-López J.C.
Publicación externa Si
Medio IOP Conf. Ser. Mater. Sci. Eng.
Alcance Conference Paper
Naturaleza Científica
Impacto SJR 0.179
Web https://www.scopus.com/inward/record.uri?eid=2-s2.0-84908417526&doi=10.1088%2f1757-899X%2f12%2f1%2f012012&partnerID=40&md5=f63b2763ab046810a56500d26e243250
Fecha de publicacion 01/01/2010
ISI 000315347000012
Scopus Id 2-s2.0-84908417526
DOI 10.1088/1757-899X/12/1/012012
Abstract In this study, we have successfully used the extended X-ray absorption fine structure (EXAFS) technique at the Ti-K edge to extract the local structure in a set of nanocomposite TiBC/a-C coatings deposited by a combined d.c.-pulsed and r.f.-magnetron sputtering deposition process. The sequence of Fourier transform spectra in the deposited films shows that there is an increase in the number of Ti-C bonds in the films of higher carbon content in parallel with the increment of the total carbon content. In addition, Ti-K EXAFS spectra indicate that in all the deposited TiBC/a-C films, first-shell neighbours are in a nearer structural arrangement than the one expected for a bulk hexagonal TiB2, which could be due to the formation of mixed Ti-B-C compound in a structural unit similar to the one found in h-TiB2. © 2010 IOP Publishing Ltd.
Palabras clave Absorption spectra; Atomic physics; Carbon; Carbon films; Extended X ray absorption fine structure spectroscopy; Light absorption; Nanocomposites; Thin films; X ray absorption; Bonding environment; Deposited films; Extended X-ray absorption fine structures; Fourier transform spectra; Local structure; Magnetron-sputtering deposition; Structural arrangement; Structural unit; Nanocomposite films
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