| Título |
Extended X-ray absorption fine structure (EXAFS) investigations of Ti bonding environment in sputter-deposited nanocomposite TiBC/a-C thin films |
| Autores |
ENDRINO ARMENTEROS, JOSÉ LUIS, Abad M.D. , Gago R. , Horwat D. , Jiménez I. , Sánchez-López J.C. |
| Publicación externa |
Si |
| Medio |
IOP Conf. Ser. Mater. Sci. Eng. |
| Alcance |
Conference Paper |
| Naturaleza |
Científica |
| Impacto SJR |
0.17900 |
| Web |
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84908417526&doi=10.1088%2f1757-899X%2f12%2f1%2f012012&partnerID=40&md5=f63b2763ab046810a56500d26e243250 |
| Fecha de publicacion |
01/01/2010 |
| ISI |
000315347000012 |
| Scopus Id |
2-s2.0-84908417526 |
| DOI |
10.1088/1757-899X/12/1/012012 |
| Abstract |
In this study, we have successfully used the extended X-ray absorption fine structure (EXAFS) technique at the Ti-K edge to extract the local structure in a set of nanocomposite TiBC/a-C coatings deposited by a combined d.c.-pulsed and r.f.-magnetron sputtering deposition process. The sequence of Fourier transform spectra in the deposited films shows that there is an increase in the number of Ti-C bonds in the films of higher carbon content in parallel with the increment of the total carbon content. In addition, Ti-K EXAFS spectra indicate that in all the deposited TiBC/a-C films, first-shell neighbours are in a nearer structural arrangement than the one expected for a bulk hexagonal TiB2, which could be due to the formation of mixed Ti-B-C compound in a structural unit similar to the one found in h-TiB2. © 2010 IOP Publishing Ltd. |
| Palabras clave |
Absorption spectra; Atomic physics; Carbon; Carbon films; Extended X ray absorption fine structure spectroscopy; Light absorption; Nanocomposites; Thin films; X ray absorption; Bonding environment; De |
| Miembros de la Universidad Loyola |
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