ENDRINO ARMENTEROS, JOSÉ LUIS, Abad M.D. , Gago R. , Horwat D. , Jiménez I. , Sánchez-López J.C.
Si
IOP Conf. Ser. Mater. Sci. Eng.
Conference Paper
Científica
0.179
01/01/2010
000315347000012
2-s2.0-84908417526
In this study, we have successfully used the extended X-ray absorption fine structure (EXAFS) technique at the Ti-K edge to extract the local structure in a set of nanocomposite TiBC/a-C coatings deposited by a combined d.c.-pulsed and r.f.-magnetron sputtering deposition process. The sequence of Fourier transform spectra in the deposited films shows that there is an increase in the number of Ti-C bonds in the films of higher carbon content in parallel with the increment of the total carbon content. In addition, Ti-K EXAFS spectra indicate that in all the deposited TiBC/a-C films, first-shell neighbours are in a nearer structural arrangement than the one expected for a bulk hexagonal TiB2, which could be due to the formation of mixed Ti-B-C compound in a structural unit similar to the one found in h-TiB2. © 2010 IOP Publishing Ltd.
Absorption spectra; Atomic physics; Carbon; Carbon films; Extended X ray absorption fine structure spectroscopy; Light absorption; Nanocomposites; Thin films; X ray absorption; Bonding environment; Deposited films; Extended X-ray absorption fine structures; Fourier transform spectra; Local structure; Magnetron-sputtering deposition; Structural arrangement; Structural unit; Nanocomposite films