Title Interface-Induced Plasmon Nonhomogeneity in Nanostructured Metal-Dielectric Planar Metamaterial
Authors Kovalev, A. I. , Wainstein, D. L. , Rashkovskiy, A. Yu. , Gago, R. , Soldera, F. , ENDRINO ARMENTEROS, JOSÉ LUIS, Fox-Rabinovich, G. S.
External publication Si
Means J. Nanomater.
Scope Article
Nature Científica
JCR Quartile 2
SJR Quartile 2
JCR Impact 1.75800
SJR Impact 0.39200
Web https://www.scopus.com/inward/record.uri?eid=2-s2.0-84926442678&doi=10.1155%2f2015%2f876247&partnerID=40&md5=c66c030400253d87a97df776c942aeb3
Publication date 01/01/2015
ISI 000352399000001
Scopus Id 2-s2.0-84926442678
DOI 10.1155/2015/876247
Abstract Transformations of the electronic structure in thin silver layers in metal-dielectric (TiAlN/Ag) multilayer nanocomposite were investigated by a set of electron spectroscopy techniques. Localization of the electronic states in the valence band and reduction of electron concentration in the conduction band was observed. This led to decreasing metallic properties of silver in the thin films. A critical layer thickness of 23.5 nm associated with the development of quantum effects was determined by X-ray photoelectron spectroscopy. Scanning Auger electron microscopy of characteristic energy losses provided images of plasmon localization in the Ag layers. The nonuniformity of plasmon intensities distribution near the metal-nitride interfaces was assessed experimentally.
Keywords Auger electron spectroscopy; Electron spectroscopy; Electronic structure; Energy dissipation; Film preparation; Plasmons; Quantum electronics; Quantum theory; Scanning electron microscopy; Silver; Cha
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