Title |
Structural and tribological characterization of Ti-In-N films deposited by magnetron sputter deposition |
Authors |
Nowicki M.A. , Krzanowski J.E. , ENDRINO ARMENTEROS, JOSÉ LUIS |
External publication |
Si |
Means |
J. Mater. Res. |
Scope |
Article |
Nature |
Científica |
JCR Quartile |
2 |
SJR Quartile |
1 |
JCR Impact |
1.713 |
SJR Impact |
0.92 |
Web |
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84857886361&doi=10.1557%2fjmr.2011.345&partnerID=40&md5=713759139f186b8a37a16ca0838de6d7 |
Publication date |
01/01/2012 |
ISI |
000304064500012 |
Scopus Id |
2-s2.0-84857886361 |
DOI |
10.1557/jmr.2011.345 |
Abstract |
TiN-indium composite films were deposited by simultaneous sputtering of titanium and indium in a mixed Argon/Nitrogen atmosphere and characterized for tribological applications. Film compositions showed a nonlinear behavior as a function of sputter gun power. For films deposited at -50 V bias, and containing less than 29 relative percent indium, the films had a face centered cubic structure, but at higher indium contents (63-82%) the structure was not consistent with either TiN or indium. At -150 V bias, the films had either the TiN structure, In-type structure, or a mixture of the two. Atomic force microscopy images showed the formation of semispherical drops on the surface of the samples deposited at -50 V bias voltage, whereas at -150 V bias voltage the samples exhibited a smooth coating surface with occasional ellipsoidal blisters. Nanoindentation test of the films shows low hardness (5-12 GPa), but tribological testing showed that frictional behavior can be improved by moderate heating before testing, suggesting indium segregation to the surface. Copyright © Materials Research Society 2011. |
Keywords |
Atomic force microscopies (AFM); Face centered cubic structure; Film composition; Frictional behavior; Indium content; Indium segregation; Low hardness; Magnetron sputter deposition; Nanoindentation tests; Nonlinear behavior; Smooth coatings; Tribological applications; Tribological characterization; Atomic force microscopy; Bias voltage; Composite films; Indium; Nanoindentation; Nitrides; Sputter deposition; Surface segregation; Surfaces; Tinning; Titanium; Tribology; Titanium nitride |
Universidad Loyola members |
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