Title Technostress Dark Side of Technology in the Workplace: A Scientometric Analysis
Authors Bondanini, Giorgia, Giorgi, Gabriele, ARIZA MONTES, JOSÉ ANTONIO, Vega-Munoz, Alejandro, Andreucci-Annunziata, Paola, ARIZA MONTES, JOSÉ ANTONIO
External publication No
Means Int. J. Environ. Res. Public Health
Scope Review
Nature Científica
JCR Quartile 1
SJR Quartile 2
Area International
Publication date 01/11/2020
ISI 000589119500001
DOI 10.3390/ijerph17218013
Abstract This article aims to provide a critical review of the scientific research on technostress. As such, global references in this field are identified and highlighted in order to manage pre-existing knowledge and establish future 'bridges' among researchers, and to enhance the presently dispersed understanding of this subject. A scientometric meta-analysis of publications on technostress was conducted to achieve this objective. Mainstream journals from the Web of Science (WoS) were used to identify current topics, relevant journals, prolific authors, institutions, and countries, 'schools of thought' and the thematic areas around which current technostress debate revolves. In this article a significant contribution comes from the use of the scientific activity itself, together with scientometric meta-analysis techniques and the application of this scientific activity, its impact and relational character, to discover relevant countries, research organizations and authors which can constitute a global reference to demarcate this knowledge frontier, and who lead the 'critical mass' of global technostress researchers. This study also distinguishes between the relevant themes studied, with co-keywords plus bibliographic coupling citation, and examines the kind of stress the most prolific authors have considered and, therefore, to discover those topics which should be studied further to deepen this research field, in search of a post-disciplinary knowledge that allows unity of focus in technology and psychology.
Keywords mental health; technostress; information-technology; dark side; work; information overload; scientometrics
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